百及纳米ParcanNano快捷型原子力显微镜AFM

简介：
公司以全球独 家专利的针尖技术为核心竞争力，技术源自于德国伊尔默瑙工业大学，致力于主动式针尖技术在微纳米结构制备和表征方面的研发，及其相关设备的产业化。

NanoMETRONOM是公司开发的一款颠覆性的新型AFM系统。它使用主动式智能针尖，集传感器、驱动器和可功能化的针尖于一身，实现自激发和自传感，无需复杂的激光校准，是取代现有AFM激光传感的巨大改进。该系统可在大气、液态及真空环境下实现对微纳米结构的高速、高效表征，成像精度达到0.2纳米的极限精度。

产品拥有像美国麻省理工学院、加州伯克利国家实验室、荷兰德尔夫特大学和清华大学等国内外知名科研客户，以及韩国三星、荷兰ASML等高端工业客户。

产品特点：
。 大气、真空及液态环境兼容
。 自激发自传感智能针尖
。 快速自动进针 无需激光调节
。 操作极其便捷 5秒快速换针
。 超高速扫描成像（100 lines/s）
。 实时光学显微镜定位扫描区域

应用领域：
。 多领域表面分析
。 工业领域快速抽检
。晶圆片表面质量监控
。 弱机械力检测
。 质量传感器
。 生化检测识别

AFM 100 nano ParcanNano fast atomic force microscope

Brief introduction:

The company takes the global exclusive patent tip technology as the core competitiveness, the technology is derived from the technical University of Ilmernau, Germany, is committed to the active tip technology in the preparation and characterization of micro and nano structure research and development, and the industrialization of related equipment.

NanoMETRONOM is a disruptive new AFM system developed by the company. It uses an active intelligent tip that combines sensors, actuators, and functionalized tips to achieve self-excitation and self-sensing without complex laser calibration, which is a huge improvement over existing AFM laser sensing. The system can achieve high speed and high efficiency characterization of micro and nano structures in atmospheric, liquid and vacuum environments, and the imaging accuracy reaches the limit accuracy of 0.2 nm.

Our products have well-known research customers at home and abroad such as Massachusetts Institute of Technology, Berkeley National Laboratory in California, Delft University and Tsinghua University in the Netherlands, as well as high-end industrial customers such as Samsung in South Korea and ASML in the Netherlands.

Product Features:

. Compatible with atmosphere, vacuum and liquid environment

. Self-excitation and self-sensing intelligent tip

. Fast automatic needle feeding without laser adjustment

. Extremely convenient operation 5 seconds fast needle change

. Ultra-high speed scanning imaging (100 lines/s)

. The scanning area was located by real-time light microscopy

Field of Application:

. Multidomain surface analysis

. Rapid spot inspection in the industrial field

. Wafer surface quality control

. Weak mechanical force detection

. Mass sensor sensor

. Identification by biochemical detection

Product advantage

The AFM 100-stage nanoParcannano high-speed atomic force microscope (AFM) uses an active intelligent needle tip that integrates a sensor, driver, and functional needle tip to achieve self-excitation and self-sensing without complex laser calibration, which is a huge improvement over existing AFM laser sensing. The system can realize high-speed and GX characterization of micro and nano structures in atmospheric, liquid and vacuum environments, and the imaging accuracy reaches the limit accuracy of 0.2 nm.